Postek, Michael T.
VIAF ID: 11365810 ( Personal )
Permalink: http://viaf.org/viaf/11365810
Preferred Forms
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- 100 1 _ ‡a Postek, Michael T.
- 100 1 _ ‡a Postek, Michael T.
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- 100 1 _ ‡a Postek, Michael T.
- 100 1 _ ‡a Postek, Michael T.
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4xx's: Alternate Name Forms (1)
Works
Title | Sources |
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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V : 24-25 August 2011, San Diego, California, United States | |
Integrated circuit metrology ... c1992: | |
Microlithography and metrology in micromachining : 23-24 October, 1995, Austin, Texas | |
Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA | |
New research in nanotechnology | |
Scanning electron microscopy, c1980 | |
Scanning microscopies 2011 : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States | |
Scanning microscopy 2010 : 17-19 May 2010, Monterey, California, United States |