Stover, John C.
VIAF ID: 111422951 ( Personal )
Permalink: http://viaf.org/viaf/111422951
Preferred Forms
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- 100 1 0 ‡a Stover, John C.
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- 100 1 _ ‡a Stover, John C.
- 100 1 _ ‡a Stover, John C.
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- 100 1 _ ‡a Stover, John C.
- 100 1 _ ‡a Stover, John C.
4xx's: Alternate Name Forms (1)
5xx's: Related Names (1)
- 510 2 _ ‡a SPIE ‡e Affiliation
Works
Title | Sources |
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Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California | |
Optical scattering : measurement and analysis | |
Scatter from optical components : 8-10 August 1989, San Diego, California |